- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 29/02 - Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
Patent holdings for IPC class G01R 29/02
Total number of patents in this class: 225
10-year publication summary
|
7
|
5
|
10
|
13
|
13
|
11
|
11
|
11
|
16
|
4
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1939 |
32 |
| Texas Instruments Incorporated | 19376 |
5 |
| International Business Machines Corporation | 60644 |
4 |
| Intel Corporation | 45621 |
4 |
| Fujitsu Limited | 19265 |
4 |
| SK Hynix Inc. | 11030 |
4 |
| ARM Limited | 4353 |
4 |
| Hunan Great-leo Microelectronics Co., Ltd. | 8 |
4 |
| Qualcomm Incorporated | 76576 |
3 |
| Mitsubishi Electric Corporation | 43934 |
3 |
| STMicroelectronics, Inc. | 886 |
3 |
| Allegro Microsystems, LLC | 1206 |
3 |
| IXYS Intl Limited | 67 |
3 |
| ROHDE & Schwarz GmbH & Co. KG | 1831 |
3 |
| Changxin Memory Technologies, Inc. | 4732 |
3 |
| NEC Corporation | 32703 |
2 |
| Robert Bosch GmbH | 40953 |
2 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
2 |
| Xilinx, Inc. | 4086 |
2 |
| Semiconductor Components Industries, L.L.C. | 5345 |
2 |
| Other owners | 133 |